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URL: https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_028211.pdf
Proper Citation: Bruker: DektakXT Stylus Profiler (RRID:SCR_028211)
Description: Advanced, stylus-based surface profiler used for high-precision, 2D and 3D surface topography measurements, including step height, surface roughness, and waviness. System measures roughness in the nanometer range. It provides a step-height repeatability of 5Å. It uses a diamond-tip stylus to physically trace samples, offering sub-nanometer vertical resolution and high repeatability.
Synonyms: , DektakXT Stylus Surface Profiler, Surface Profilometer (DektakXT)
Resource Type: instrument resource
Keywords: surface profilometer, thin film metrology, roughness measurement, step height analysis
Availability: Commercially available
Specification URL: https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_028211.pdf
Resource Name: Bruker: DektakXT Stylus Profiler
Resource ID: SCR_028211
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400
