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Sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films, from beryllium Be through uranium U

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Sequential WDXRF spectrometer for large samples with elemental analysis of solids, liquids, powders, alloys and thin films.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Tube above sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films,from Oxygen fhrough Uranium.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Compact 2D X ray camera with micron and sub micron resolution for imaging.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated in situ x ray crystallography that screens protein crystals on single crystal X ray diffractometer.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Compact 2D X ray camera for topography and imaging applications X ray and EUV detector.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Benchtop single crystal x ray diffractometer.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Surface contamination metrology that measures elemental contamination at discrete points or with full wafer maps.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Simultaneous WDXRF spectrometer film thickness and composition measurements on wafers and media disks.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Dual wavelength Confocal Max Flux CMF optics for single crystal X ray diffraction. Focuses and monochromatizes two different X ray wavelengths for single crystal X ray diffraction applications.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

In line, simultaneous WDXRF spectrometer film thickness and composition measurements on blanket wafers.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Thermomechanical analyzer. Measurement of a mechanical property change with respect to temperature.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

18 kW rotating anode X-ray generator. A high powered X-ray source that can produce point or line focus X-ray beams.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Wafer surface contamination metrology by VPD TXRF with measurement of ultra trace elemental surface contamination.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

High power benchtop sequential WDXRF spectrometer.Used for elemental analysis of solids, liquids, powders, alloys and thin films.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated multipurpose diffractometer. Powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and in plane experiments.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Wafer surface contamination metrology by TXRF with measurement of trace elemental surface contamination.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Humidity controlled TMA.Measurement of mechanical property change with respect to temperature and humidity.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Simultaneous Thermal Analyzer.Measures weight changes and endothermic or exothermic reaction.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Surface contamination metrology. Used to measure elemental contamination at discrete points or with full wafer maps.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth