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Showing 20 out of 28,805 Resources on page 438

JEOL: JCM-7000 NeoScope Benchtop Scanning Electron Microscope (SEM)

Scanning electron microscope that is equipped with large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real time 3D imaging, highly advanced auto functions and option to add fully embedded EDS with real time, Live, analysis.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEOL: JEM-1400Flash Transmission Electron Microscope

Transmission electron microscope that can be used to first view samples at low magnification before studying fine structures of interest at high magnification.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JIB-4000PLUS Focused Ion Beam

Focused ion bean that is milling and imaging system featuring high performance ion optical column

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer

Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer

Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEM-F200 F2 Transmission Electron Microscope

Transmission scanning electron microscope that offers Cold Field Emission Gun and dual Silicon Drift Detectors

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEM-ARM300F Transmission Electron Microscope

Transmission electron microscope that is designed to meet most advanced materials development requirements for atom by atom characterization and chemical mapping

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEM-2100Plus Transmission Electron Microscope

Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEBG-3000UB High Power Electron Beam Source

A high power electron beam source that is designed to uniformly deposit metal oxides onto wide plastic films or steel plates in continuous feed such as in magnetic tape manufacture for high density recording or in wrapping film manufacture with oxide barrier function

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JBX-9500FS Electron Beam Lithography System

Electron beam lithography system that is versatile in its applications from basic research of elements to test production of optical elements to research and development for masks for high accelerating voltage exposure.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JBX-8100FS Electron Beam Lithography System

Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JEBG-1000UB High Power Electron Beam Source

High power electron beam source that is designed to uniformly deposit metal oxides onto wide plastic films or steel plates in continuous feed such as in magnetic tape manufacture for high density recording or in wrapping film manufacture with oxide barrier function

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA)

Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: InfiTOF Multi-Turn Time-of-Flight Mass Spectrometer

Mass spectrometer that can determine elemental compositions for ions within range of m/z 1 to 1,000. Hydrogen ion H plus can be detected with multi turn and multi segment that obtains high resolution with small ion flight path design.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: JBX-3050MV Electron Beam Lithography System

Electron beam lithography system for mask reticle fabrication that meets design rule of 45 to 32 nm and pattern writing with high speed, high accuracy and high reliability, achieved by high end technology

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: GC Mate II Mass Spectrometer

Benchtop double focusing magnetic sector mass spectrometer operating in electron ionization mode with TSS 2000 software.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: IB-29500VED/IB-29510VET Vacuum Evaporator Sample Preparation Tool

High vacuum specimen sample preparation tool. Preparation device that makes it easy to prepare samples for imaging and analysis with with electron microscopes.

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: CRYO ARM 300 Transmission Electron Microscope

Transmission electron microscope field emission cryo electron microscope that allows for automated detection of holes on specimen grid for automated, unattended acquisition of high resolution images

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: ElementEye JSX-1000S XRF Fluorescence Spectrometer

Fluoresence spectormeer that analyzes major to trace components on most sample types solids, powders, liquids with little or no sample preparation

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth

JEOL: CRYO ARM 200 Transmission Electron Microscope

Transmission elecctron microscope that achieves unprecedented resolution and stability allowing for automatic and unattended acquisitoin of image data for Single Particle Analysis

  • Resource
  • SciCrunch
  • 6 years ago - submitted by Edyta Vieth