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Scanning electron microscope that is equipped with large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real time 3D imaging, highly advanced auto functions and option to add fully embedded EDS with real time, Live, analysis.
Transmission electron microscope that can be used to first view samples at low magnification before studying fine structures of interest at high magnification.
Focused ion bean that is milling and imaging system featuring high performance ion optical column
Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.
Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.
Transmission scanning electron microscope that offers Cold Field Emission Gun and dual Silicon Drift Detectors
Transmission electron microscope that is designed to meet most advanced materials development requirements for atom by atom characterization and chemical mapping
Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation.
A high power electron beam source that is designed to uniformly deposit metal oxides onto wide plastic films or steel plates in continuous feed such as in magnetic tape manufacture for high density recording or in wrapping film manufacture with oxide barrier function
Electron beam lithography system that is versatile in its applications from basic research of elements to test production of optical elements to research and development for masks for high accelerating voltage exposure.
Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput.
High power electron beam source that is designed to uniformly deposit metal oxides onto wide plastic films or steel plates in continuous feed such as in magnetic tape manufacture for high density recording or in wrapping film manufacture with oxide barrier function
Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity.
Mass spectrometer that can determine elemental compositions for ions within range of m/z 1 to 1,000. Hydrogen ion H plus can be detected with multi turn and multi segment that obtains high resolution with small ion flight path design.
Electron beam lithography system for mask reticle fabrication that meets design rule of 45 to 32 nm and pattern writing with high speed, high accuracy and high reliability, achieved by high end technology
Benchtop double focusing magnetic sector mass spectrometer operating in electron ionization mode with TSS 2000 software.
High vacuum specimen sample preparation tool. Preparation device that makes it easy to prepare samples for imaging and analysis with with electron microscopes.
Transmission electron microscope field emission cryo electron microscope that allows for automated detection of holes on specimen grid for automated, unattended acquisition of high resolution images
Fluoresence spectormeer that analyzes major to trace components on most sample types solids, powders, liquids with little or no sample preparation
Transmission elecctron microscope that achieves unprecedented resolution and stability allowing for automatic and unattended acquisitoin of image data for Single Particle Analysis