Curator Dashboard

Humidity controlled TMA.Measurement of mechanical property change with respect to temperature and humidity.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Simultaneous Thermal Analyzer.Measures weight changes and endothermic or exothermic reaction.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Surface contamination metrology. Used to measure elemental contamination at discrete points or with full wafer maps.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Humidity Controlled TG-DTA.Compact humidity generator HUM 1 is connected to TG DTA for measurements under constant relative humidity water vapor atmosphere. Measures weight changes and endothermic or exothermic reactions.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Multipurpose X-ray diffraction system with built in intelligent guidance that includes powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and non ambient experiments.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Non destructive portable stress analyzer for field and indoor use.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated multipurpose X-Ray diffractometer with guidance software. Power diffraction, thin film metrology, SAXS, in plane scattering, and operando measurements.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Tube above simultaneous wavelength dispersive X-ray fluorescence spectrometer.Used for high-throughput elemental analysis of solids, powders and alloys.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Advanced 1064 NM handheld raman spectrometer for raw material identification, material verification and authentication.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument. Metals checks in shoes, bags, general merchandise and apparel products by X ray.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

New 1064 NM handheld raman analyzer for explosives and narcotics detection fast chemical detection

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

200 kV microcomputerized directional industrial X ray system.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

300 kV microcomputerized directional industrial X ray system

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

R- AXIS IV is a two- dimensional X- ray detector which collects diffracted X- ray data used for small or macromolecular crystal structure analysis. A complete X-ray detector system consists of the X- ray generator, optics, R-AXIS IV main body, R-AXIS IV controller, and control/data processing software (com-puter).

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Small, light weight non destructive testing X ray generator. Performs inspections by X ray radiography in narrow or high places.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Next generation benchtop total reflection X ray fluorescence TXRF spectrometer. Rapid trace elemental analysis and thin film characterization.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Original 1064 NM handheld raman for chemical threat analysis. Used for rapid chemical identification of unknown substances.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

R-AXIS HTC was designed with speed in mind. High throughput crystallography requires an area detector that can measure accurate data rapidly. The R-AXIS HTC combines the data quality that is achieved with an imaging plate area detector with data acquisition speed that approaches that of an electronic detector. It combines three large active area imaging plates with minimal dead-time and a wide dynamic range, making it best for collecting fast, accurate diffraction data from the widest ranges of samples in the home laboratory. High dynamic range is achieved through use of a dual photomultiplier configuration that allows high intensities to be measured by a second, attenuated photomultiplier.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth