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PIN diode based X-ray detector.Applications ranging from alignment and testing of laboratory devices to long term precision monitoring of X-ray intensity.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

THIS RESOURCE IS NO LONGER IN SERVICE. April 10,2024. Roche Diagnostics Elecsys 2010 has the power and efficiency to meet the needs of medium and large volume testing facilities. Roche Elecsys 2010, which is available in the form of sample disk or a rack handling system, can be operated in both continuous and random access modes. The throughput rate of this analyzer is 86 tests per hour and on-board capacity is of 15 tests. Elecsys 2010 disk and Elecsys 2010 rack holds 30 and 100 positions for samples respectively. With Roche Elecsys 2010 system at your workstation, you can attain benefits such as easy and trouble free operation, workflow flexibility, faster turnaround times, broad measuring ranges, and more.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Thermo Scientific CRS F3 Robot Arm and C500C Controller is designed for light payload applications and provides an articulated robot arm with six degrees of freedom, plus a powerful, multitasking controller. The system sets a new standard for "human-scale" robots, delivering a combination of high speed, reliability, ease of use, and value. It dramatically increases walk-away time and reduces human error by automating container handling for a wide variety of instruments and devices. The F3 can carry payloads up to 3kg, enabling it to carry multiple containers at once. The arm of the system communicates with its external controller, sensors and other devices along a dedicated communication network, eliminating the masses of wires required by traditional robots. The F3 arm can store position data for up to eight weeks, even if the robot and controller are disconnected.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films, from beryllium Be through uranium U

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Sequential WDXRF spectrometer for large samples with elemental analysis of solids, liquids, powders, alloys and thin films.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Tube above sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films,from Oxygen fhrough Uranium.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Compact 2D X ray camera with micron and sub micron resolution for imaging.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated in situ x ray crystallography that screens protein crystals on single crystal X ray diffractometer.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Compact 2D X ray camera for topography and imaging applications X ray and EUV detector.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Benchtop single crystal x ray diffractometer.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Surface contamination metrology that measures elemental contamination at discrete points or with full wafer maps.

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• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Simultaneous WDXRF spectrometer film thickness and composition measurements on wafers and media disks.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Dual wavelength Confocal Max Flux CMF optics for single crystal X ray diffraction. Focuses and monochromatizes two different X ray wavelengths for single crystal X ray diffraction applications.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

In line, simultaneous WDXRF spectrometer film thickness and composition measurements on blanket wafers.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Thermomechanical analyzer. Measurement of a mechanical property change with respect to temperature.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

18 kW rotating anode X-ray generator. A high powered X-ray source that can produce point or line focus X-ray beams.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Wafer surface contamination metrology by VPD TXRF with measurement of ultra trace elemental surface contamination.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

High power benchtop sequential WDXRF spectrometer.Used for elemental analysis of solids, liquids, powders, alloys and thin films.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated multipurpose diffractometer. Powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and in plane experiments.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Wafer surface contamination metrology by TXRF with measurement of trace elemental surface contamination.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth