Curator Dashboard

High power benchtop sequential WDXRF spectrometer.Used for elemental analysis of solids, liquids, powders, alloys and thin films.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated multipurpose diffractometer. Powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and in plane experiments.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Wafer surface contamination metrology by TXRF with measurement of trace elemental surface contamination.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Humidity controlled TMA.Measurement of mechanical property change with respect to temperature and humidity.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Simultaneous Thermal Analyzer.Measures weight changes and endothermic or exothermic reaction.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Surface contamination metrology. Used to measure elemental contamination at discrete points or with full wafer maps.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Humidity Controlled TG-DTA.Compact humidity generator HUM 1 is connected to TG DTA for measurements under constant relative humidity water vapor atmosphere. Measures weight changes and endothermic or exothermic reactions.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Multipurpose X-ray diffraction system with built in intelligent guidance that includes powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and non ambient experiments.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Non destructive portable stress analyzer for field and indoor use.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Automated multipurpose X-Ray diffractometer with guidance software. Power diffraction, thin film metrology, SAXS, in plane scattering, and operando measurements.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Tube above simultaneous wavelength dispersive X-ray fluorescence spectrometer.Used for high-throughput elemental analysis of solids, powders and alloys.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Advanced 1064 NM handheld raman spectrometer for raw material identification, material verification and authentication.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument. Metals checks in shoes, bags, general merchandise and apparel products by X ray.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

New 1064 NM handheld raman analyzer for explosives and narcotics detection fast chemical detection

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Foreign object X ray inspection instrument.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

200 kV microcomputerized directional industrial X ray system.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

300 kV microcomputerized directional industrial X ray system

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

R- AXIS IV is a two- dimensional X- ray detector which collects diffracted X- ray data used for small or macromolecular crystal structure analysis. A complete X-ray detector system consists of the X- ray generator, optics, R-AXIS IV main body, R-AXIS IV controller, and control/data processing software (com-puter).

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth

Small, light weight non destructive testing X ray generator. Performs inspections by X ray radiography in narrow or high places.

• Resource
• SciCrunch
• 6 years ago - submitted by Edyta Vieth