URL: https://www.jeol.com/products/scientific/sem/JSM-7800F.php
Proper Citation: JEOL JSM-7800F Field Emission Scanning Electron Microscope (RRID:SCR_028353)
Description: Ultra-high-resolution, Schottky field-emission scanning electron microscope (FE-SEM) designed for advanced nano-characterization, combining in-lens technology with a super hybrid lens to achieve 0.8 nm resolution. It is utilized for high-resolution imaging, elemental analysis (EDS/WDS), and crystallographic analysis (EBSD) of materials, magnetic samples, and non-conductive specimens, even at very low voltages (down to 10 V).
Synonyms: JSM-7800F Field Emission Scanning Electron Microscope
Resource Type: instrument resource
Keywords: Schottky, field-emission, scanning electron microscope,
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