URL: https://www.fei.com/products/efa/hyperion-II-for-semiconductors/
Proper Citation: FEI: Hyperion II System (RRID:SCR_019885)
Description: Electrical failure analysis system for semiconductors that offers transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.
Resource Type: instrument resource
Keywords: FEI, EFA System, Instrument Equipment, USEDit,
Availability: Commercially available
Resource Name: FEI: Hyperion II System
Resource ID: SCR_019885
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400
