URL: https://afm.oxinst.com/outreach/the-most-versatile-afm
Proper Citation: Oxford: Asylum Research MFP 3D Atomic Force Microscopes (RRID:SCR_019581)
Description: Asylum Research MFP-3D family of AFM's extend beyond basic topography measurements with diverse set of available accessories designed to enhance capabilities of the AFM. These include accessories for making nano-electric measurements, for example conductivity and piezoelectric response, measurements under magnetic fields, measuring nanomechanical properties, and controlling the temperature and humidity.
Resource Type: instrument resource
Keywords: Asylum, Atomic Force Microscope, Instrument, Equipment, USEDit
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