URL: http://www.mcpf.hkust.edu.hk/service.php?id=PE022
Proper Citation: FEI Helios G4 UX (RRID:SCR_021773)
Description: Dual beam FIB/FESEM system, containing both focused Ga plus ion beam and ultra high resolution field emission scanning electron column and their combined use. Dual beam focused ion beam scanning electron microscope for nanofabrication.
Synonyms: Helios G4 UX
Resource Type: instrument resource
Keywords: FIB, SEM, nanofabrication, dual beam, focused ion beam, scanning electron microscope, USEDit
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