URL: https://www.amnh.org/research/microscopy-and-imaging-facility/instruments/hitachi-s-4699
Proper Citation: Hitachi: S4700 Field Emission Scanning Electron Microscope (RRID:SCR_020019)
Description: Hitachi S-4700 is a field emission scanning electron microscope (FE-SEM). More than a standard SEM, the S-4700, under optimal conditions, can magnify images upwards of 500,000 times and resolve features to 2 nanometers. In addition, a cathodoluminescence detector, backscatter electron detector and energy dispersive x-ray spectrographic detector accompany the microscope., THIS RESOURCE IS NO LONGER IN SERVICE. Documented on September 16,2025.
Resource Type: instrument resource
Keywords: Hitachi, Field Emission Scanning Electron Microscope, Instrument Equipment, USEDit
Availability: THIS RESOURCE IS NO LONGER IN SERVICE
Resource Name: Hitachi: S4700 Field Emission Scanning Electron Microscope
Resource ID: SCR_020019
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Source: SciCrunch Registry (RRID:SCR_005400)
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URL: https://rrid.site/rin/sources/SCR_005400
