URL: https://www.jeolusa.com/PRODUCTS/Transmission-Electron-Microscopes-TEM/120-kV/JEM-1400Flash
Proper Citation: Jeol JEOL JEM-1400Flash Transmission Electron Microscope (RRID:SCR_020179)
Description: Transmission electron microscope that can be used to first view samples at low magnification before studying fine structures of interest at high magnification.
Resource Type: instrument resource
Keywords: Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit,
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