URL: http://www.udel.edu/chem/beebe/surface.htm
Proper Citation: Delaware University Surface Analysis Core Facility (RRID:SCR_017796)
Description: Core provides consulting and services in X-ray Photoelectron Spectroscopy (XPS or ESCA), Time-of-Flight Secondary-Ion Mass Spectrometry (TOF-SIMS), X-ray Photoelectron Imaging, Auger Electron Spectroscopy (AES), Scanning Auger Microscopy or Imaging (SAM), Secondary-Electron Microscopy (SEM), Ion-Scattering Spectroscopy (ISS or LEIS), Scanning Probe Microscopy (STM and AFM).
Synonyms: Surface Analysis Facility
Resource Type: core facility, access service resource, service resource
Keywords: Surface, analysis, X-ray, photoelectron, spectroscopy, ion, mass, spectrometry, imaging, Auger, microscopy, scattering, scanning, probe, service, core
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