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URL: https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_028212.pdf
Proper Citation: Filmetrics F20 Thin Film Measurement System (RRID:SCR_028212)
Description: Filmetrics F20 is a versatile, benchtop thin-film measurement system designed to measure the thickness, refractive index, and extinction coefficient of thin films. Using spectral reflectance in less than a second, it measures single or multi-layer stacks.
Synonyms: , Filmetrics F20 Thin-Film Analyzer
Resource Type: instrument resource
Keywords: benchtop thin-film measurement system, measure thickness, refractive index, extinction coefficient, thin films,
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