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URL: https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_028211.pdf
Proper Citation: Bruker: DektakXT Stylus Profiler (RRID:SCR_028211)
Description: Advanced, stylus-based surface profiler used for high-precision, 2D and 3D surface topography measurements, including step height, surface roughness, and waviness. System measures roughness in the nanometer range. It provides a step-height repeatability of 5Å. It uses a diamond-tip stylus to physically trace samples, offering sub-nanometer vertical resolution and high repeatability.
Synonyms: , DektakXT Stylus Surface Profiler, Surface Profilometer (DektakXT)
Resource Type: instrument resource
Keywords: surface profilometer, thin film metrology, roughness measurement, step height analysis
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