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Proper Citation: Zeiss Xradia 620 Versa X-ray microscope (RRID:SCR_028320)
Description: High-resolution 3D X-ray microscope (micro-CT) designed for non-destructive, submicron imaging of internal structures in materials science, electronics, and life sciences. It allows researchers to visualize 3D details at 500 nm resolution without cutting samples, using "Resolution at a Distance" (RaaD™) technology to image large or complex items.
Synonyms: ZEISS Xradia 620 Versa
Resource Type: instrument resource
Keywords: ABRF, 3D X-ray microscope, micro-CT, non-destructive, submicron, imaging, materials internal structures,
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