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URL: http://www.mcpf.hkust.edu.hk/service.php?id=PE022
Proper Citation: FEI: Helios G4 UX (RRID:SCR_021773)
Description: Dual beam FIB/FESEM system, containing both focused Ga plus ion beam and ultra high resolution field emission scanning electron column and their combined use. Dual beam focused ion beam scanning electron microscope for nanofabrication.
Synonyms: Helios G4 UX
Resource Type: instrument resource
Keywords: FIB, SEM, nanofabrication, dual beam, focused ion beam, scanning electron microscope, USEDit
Availability: Commercially available
Resource Name: FEI: Helios G4 UX
Resource ID: SCR_021773
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400
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