URL: https://www.amnh.org/research/microscopy-and-imaging-facility/instruments/hitachi-s-4699
Proper Citation: Hitachi S4700 Field Emission Scanning Electron Microscope (RRID:SCR_020019)
Description: Hitachi S-4700 is a field emission scanning electron microscope (FE-SEM). More than a standard SEM, the S-4700, under optimal conditions, can magnify images upwards of 500,000 times and resolve features to 2 nanometers. In addition, a cathodoluminescence detector, backscatter electron detector and energy dispersive x-ray spectrographic detector accompany the microscope.
Resource Type: instrument resource
Keywords: Hitachi, Field Emission Scanning Electron Microscope, Instrument Equipment, USEDit
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