URL: https://www.fei.com/products/tem/talos-f200i-for-materials-science/
Proper Citation: FEI Talos F200i TEM and STEM (RRID:SCR_019911)
Description: Microscope that is designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.
Resource Type: instrument resource
Keywords: FEI, TEM, Instrument Equipment, USEDit,
Expand AllWe found {{ ctrl2.mentions.total_count }} mentions in open access literature.
We have not found any literature mentions for this resource.
We are searching literature mentions for this resource.
Most recent articles:
{{ mention._source.dc.creators[0].familyName }} {{ mention._source.dc.creators[0].initials }}, et al. ({{ mention._source.dc.publicationYear }}) {{ mention._source.dc.title }} {{ mention._source.dc.publishers[0].name }}, {{ mention._source.dc.publishers[0].volume }}({{ mention._source.dc.publishers[0].issue }}), {{ mention._source.dc.publishers[0].pagination }}. (PMID:{{ mention._id.replace('PMID:', '') }})
Check
for all resource mentions.
A list of researchers who have used the resource and an author search tool
Find mentions based on location
{{ ctrl2.mentions.errors.location }}
A list of researchers who have used the resource and an author search tool. This is available for resources that have literature mentions.
No rating or validation information has been found for FEI Talos F200i TEM and STEM.
No alerts have been found for FEI Talos F200i TEM and STEM.
Source: SciCrunch Registry
