URL: https://www.fei.com/products/sem/phenom-pro/
Proper Citation: FEI Phenom Pro Desktop SEM (RRID:SCR_019902)
Description: Desktop scanning electron microscope with CeB6 source that offers high brightness while requiring low maintenance. It allows sample structures to be physically examined and their elemental composition determined.
Resource Type: instrument resource
Keywords: FEI, SEM, Instrument Equipment, USEDit,
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