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Arizona State University Knowledge Enterprise: EMC X-ray Photoelectron Spectroscopy (XPS) Kratos Axis Supra + (RRID:SCR_028605)Copy Citation Copied
URL: https://cores.research.asu.edu/materials/equipment/x-ray-photoelectron-spectroscopy
Proper Citation: Arizona State University Knowledge Enterprise: EMC X-ray Photoelectron Spectroscopy (XPS) Kratos Axis Supra + (RRID:SCR_028605)
Description: Advanced X-ray Photoelectron Spectrometer (XPS) to determine the chemical composition and bonding states of the very outermost surface of a material (the top 10 nm). XPS depth profiling can be performed to determine elemental composition and chemical bonding information for layers below the surface. Relative atomic concentration percentages can be determined with a sensitivity of 0.1 to 1 atomic % for Li and heavier elements. The analysis is carried out in an ultrahigh vacuum system (~10-9 Torr/10-7 Pa or better). It serves researchers from a variety of fields including materials science and engineering, Electronics and Semiconductors, Energy Storage & Conversion, Catalysis & Petrochemicals and Polymer & Surface Engineering. Features: Large area XPS analysis with high sensitivity and faster acquisition times. Parallel XPS imaging from 10 mm2 to 200?m2 with 1?m ultimate spatial resolution. Pre-defined small spot analysis with the smallest diameter 15 ?m. XPS Depth-profiling and Angle-Resolved analysis. Dual monochromatic Al/Ag source with a high-energy resolution (Al K-alpha 1486.6eV & Ag L-alpha 2984.2eV, line width 0.48eV on Ag 3d5/2 and 0.408eV on Si 2p3/2). A Minibeam 6 Arn+ cluster ion gun for relative depth profiling and sputtering cleaning. Multi-Technique Capability: ultraviolet photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS), and reflection electron energy loss spectroscopy (REELS).
Synonyms: Kratos AXIS Supra+
Resource Type: instrument resource
Keywords: determine chemical composition, bonding states, material surface,
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