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https://www.jeolusa.com/PRODUCTS/Microprobe-EPMA-and-Auger/JXA-iHP200F

Electron probe microanalyzer that provides both high imaging resolution and analytical resolution with very high and stable probe current for analytical performance.

Proper citation: JEOL: JXA-iHP200F Field Emission Electron Probe Microanalyzer (EPMA) (RRID:SCR_020192) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/MStation

Mass spectrometer with ion optics design that permits rapid and auto tuning with minimal operator intervention, even under high resolution conditions.

Proper citation: JEOL: MStation Mass Spectrometer (RRID:SCR_020193) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/sample-preparation-for-electron-microscopy/p/leica-em-uc6/

Leica Ultracut EM UC6 is an advanced ultramicrotome that features a Touch Screen Control Panel or a Keypad Control Panel. Both options enable fast and safer alignment of knife and specimen, and the programmable knife and cutting movements make trimming easy. With Leica's AutoTrim, you can automatically trim a specimen to a predetermined level in the block face, best for morphometric studies. Three dependent, built-in, brightness- controlled LED light sources provide outstanding illumination for top light, back light, and specimen transillumination.

Proper citation: Leica: EM FC6 UC6b Ultramicrotome (RRID:SCR_020226) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/light-microscopes/p/leica-dm1000-led/

Leica DM1000 LED Histology Microscope features long-life LED illumination that provides near daylight, bright illumination with constant color temperature and emits less heat.. Users of the Leica DM1000 LED benefit from the system's ability to adapt to every user. the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF).

Proper citation: Leica: DM1000 Histology Microscope (RRID:SCR_020225) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/High-Res-Large-Chamber-SEM/JSM-IT500HR

Scanning Electron Microscope that provides high resolution imaging along with high sensitivity and high spatial resolution analysis

Proper citation: JEOL: JSM-IT500HR InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020189) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/sample-preparation-for-electron-microscopy/p/leica-em-afs2/

System for Light and Electron Microscopy. Performs freeze substitution and progressive lowering of temperature techniques and allows low temperature embedding and polymerization of resins. Leica EM FSP (freeze substitution processor), automatic reagent handling system combined with Leica EM AFS2, dispenses reagents for both freeze substitution and PLT applications. The LED illumination from within the chamber and the attached stereomicroscope for viewing and positioning of samples ensures ease of use.

Proper citation: Leica: EM AFS2 Freeze Substitution and Low Temperature Embedding System (RRID:SCR_020222) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/light-microscopes/p/leica-dm2000/

Leica DM2000 microscopes are best for complex tasks in pathology and cytology. For special diagnostics requirements, the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF).

Proper citation: Leica: DM2000 Histology Microscope (RRID:SCR_020223) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Electron-Spin-Resonance/JES-X310

Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.

Proper citation: JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020176) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Electron-Spin-Resonance/JES-X320

Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability.

Proper citation: JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020177) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Transmission-Electron-Microscopes-TEM/200-kV/JEM-2100Plus

Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation.

Proper citation: JEOL: JEM-2100Plus Transmission Electron Microscope (RRID:SCR_020173) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Photomask-Direct-Write-Lithography/Electron-Beam-Lithography/JBX-8100FS

Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput.

Proper citation: JEOL: JBX-8100FS Electron Beam Lithography System (RRID:SCR_020170) Copy   

•   Source: SciCrunch Registry

https://www.kratos.com/products/axis-nova

AXIS Nova combines XPS imaging and spectroscopic capabilities with a highly automated, large sample handling system and is the next generation of AXIS Nova spectrometer. The AXIS Nova is based on Kratos, AXIS technology comprising: magnetic and electrostatic transfer lenses; co-axial electron-only charge neutralisation; spherical mirror and hemispherical electron energy analysers. Kratos developed innovations such as the delay-line detector for spectroscopy and imaging modes and high energy X-ray excitation sources ensure the AXIS Nova is capable of performing in the most demanding research and development environments.

Proper citation: Kratos: AXIS-165 XPS Surface Analylsis System (RRID:SCR_020207) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Microprobe-EPMA-and-Auger/JAMP-9500F

Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity.

Proper citation: JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) (RRID:SCR_020168) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/SpiralTOF-MALDI-TOF-TOF

Mass spectrometer with long flight path that results in ultrahigh resolving power greater than 75,000 and sub ppm mass accuracy.

Proper citation: JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer (RRID:SCR_020201) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Nuclear-Magnetic-Resonance/Probes/ROYAL-Probe

Probe that combines performance of broadband probe for heteronuclear measurements and inverse probe for 1H and 19F measurements.

Proper citation: JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe (RRID:SCR_020208) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/stereo-microscopes-macroscopes/p/leica-s8-apo/

Greenough stereo microscope, Leica S8 APO with apochromatic 8:1 zoom and 75mm working distance allows easy access to specimen even at high magnification up to 80x which is best for quality control, cell sorting and microinjection applications. Ergonomic 38 viewing angle provides comfort, which helps increase productivity, reduce fatigue related inspection errors and acquire precise positioning while working with incident or transmitted light. Adjustable zoom stops allows fast, easy, repeatable measurements and inspections. The Integrated Documentation port allows to connect digital cameras.

Proper citation: Leica: APO S8 Microscope (RRID:SCR_020209) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Focused-Ion-Beam/JIB-4700F

Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens.

Proper citation: JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/HV-LV-Tungsten-LaB6-SEMs/JSM-IT200-InTouchScope

Scanning electron microscope that is compact and versatile and delivers high resolution imaging with unsurpassed low kV performance and high sensitivity solid state BSE detector included with LV models.

Proper citation: JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Nuclear-Magnetic-Resonance/JNM-ECZR

Nuclear magnetic resonance spectormeter that enables highly sophisticated measurements to be carried out while most routine measurement operations can be performed automatically.

Proper citation: JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer (RRID:SCR_020183) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/GC-Single-Quadrupole-Mass-Spectrometer

Mass spectrometer that can be used for wide range of applications such as environmental analysis for agrichemicals and mold odor, material analysis, and aroma analysis.

Proper citation: JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer (RRID:SCR_020182) Copy   

•   Source: SciCrunch Registry