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| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
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JEOL: JSM-7900F Field Emission Scanning Electron Microscope (SEM) Resource Report Resource Website |
JEOL: JSM-7900F Field Emission Scanning Electron Microscope (SEM) (RRID:SCR_020191) | instrument resource | Scanning electron microscope with flexible platform that combines high resolution imaging with nano scale microanalysis. | Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JSM_7900F | SCR_020191 | 2026-07-25 12:09:23 | 0 | ||||||||||
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JEOL: ROYAL HFX Nuclear Magnetic Resonance (NMR) Probe Resource Report Resource Website |
JEOL: ROYAL HFX Nuclear Magnetic Resonance (NMR) Probe (RRID:SCR_020199) | instrument resource | NMR probe that has capability to switch between single tune and dual tune modes on high frequency coil. | Jeol, JEOL, Nuclear Magnetic Resonance Probe, Instrument Equipment, USEDit, | Commercially available | Model_Number_ROYAL_HFX | SCR_020199 | 2026-07-25 12:09:24 | 0 | ||||||||||
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JEOL: NEOARM Transmission Electron Microscope Resource Report Resource Website |
JEOL: NEOARM Transmission Electron Microscope (RRID:SCR_020197) | instrument resource | Transmission electron microscope that enables atomic resolution imaging | Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_NEOARM | SCR_020197 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: JXA-iHP200F Field Emission Electron Probe Microanalyzer (EPMA) Resource Report Resource Website 1+ mentions |
JEOL: JXA-iHP200F Field Emission Electron Probe Microanalyzer (EPMA) (RRID:SCR_020192) | instrument resource | Electron probe microanalyzer that provides both high imaging resolution and analytical resolution with very high and stable probe current for analytical performance. | Jeol, JEOL, Electron Probe Microanalyzer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JXA_iHP200F | SCR_020192 | 2026-07-25 12:09:24 | 4 | ||||||||||
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JEOL: MStation Mass Spectrometer Resource Report Resource Website |
JEOL: MStation Mass Spectrometer (RRID:SCR_020193) | instrument resource | Mass spectrometer with ion optics design that permits rapid and auto tuning with minimal operator intervention, even under high resolution conditions. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_MStation | SCR_020193 | 2026-07-25 12:09:25 | 0 | ||||||||||
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Leica: EM FC6 UC6b Ultramicrotome Resource Report Resource Website 1+ mentions |
Leica: EM FC6 UC6b Ultramicrotome (RRID:SCR_020226) | instrument resource | Leica Ultracut EM UC6 is an advanced ultramicrotome that features a Touch Screen Control Panel or a Keypad Control Panel. Both options enable fast and safer alignment of knife and specimen, and the programmable knife and cutting movements make trimming easy. With Leica's AutoTrim, you can automatically trim a specimen to a predetermined level in the block face, best for morphometric studies. Three dependent, built-in, brightness- controlled LED light sources provide outstanding illumination for top light, back light, and specimen transillumination. | Leica, Ultramicrotome, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020226.pdf | Model_Number_UC6b | SCR_020226 | 2026-07-25 12:09:24 | 8 | |||||||||
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Leica: DM1000 Histology Microscope Resource Report Resource Website 1+ mentions |
Leica: DM1000 Histology Microscope (RRID:SCR_020225) | instrument resource | Leica DM1000 LED Histology Microscope features long-life LED illumination that provides near daylight, bright illumination with constant color temperature and emits less heat.. Users of the Leica DM1000 LED benefit from the system's ability to adapt to every user. the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF). | Leica, Histology Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020225.pdf | Model_Number_DM1000 | SCR_020225 | 2026-07-25 12:09:23 | 2 | |||||||||
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JEOL: JSM-IT500HR InTouchScope Scanning Electron Microscope (SEM) Resource Report Resource Website |
JEOL: JSM-IT500HR InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020189) | instrument resource | Scanning Electron Microscope that provides high resolution imaging along with high sensitivity and high spatial resolution analysis | Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JSM-IT500HR InTouchScope | SCR_020189 | 2026-07-25 12:09:24 | 0 | ||||||||||
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Leica: EM AFS2 Freeze Substitution and Low Temperature Embedding System Resource Report Resource Website |
Leica: EM AFS2 Freeze Substitution and Low Temperature Embedding System (RRID:SCR_020222) | instrument resource | System for Light and Electron Microscopy. Performs freeze substitution and progressive lowering of temperature techniques and allows low temperature embedding and polymerization of resins. Leica EM FSP (freeze substitution processor), automatic reagent handling system combined with Leica EM AFS2, dispenses reagents for both freeze substitution and PLT applications. The LED illumination from within the chamber and the attached stereomicroscope for viewing and positioning of samples ensures ease of use. | Leica, freeze substitution system, progressive lowering of temperature, freeze substitution processor, device, Instrument Equipment, USEDit | Restricted | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020222.pdf | Model_Number_EM_AFS2, SCR_020230 | SCR_020222 | Leica EM AFS2 | 2026-07-25 12:09:25 | 0 | ||||||||
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Leica: DM2000 Histology Microscope Resource Report Resource Website 1+ mentions |
Leica: DM2000 Histology Microscope (RRID:SCR_020223) | instrument resource | Leica DM2000 microscopes are best for complex tasks in pathology and cytology. For special diagnostics requirements, the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF). | Leica, Histology Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020223.pdf | Model_Number_DM2000 | SCR_020223 | 2026-07-25 12:09:24 | 3 | |||||||||
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JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer Resource Report Resource Website |
JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020176) | instrument resource | Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability. | Jeol, JEOL, Electron Spin Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JES_X310 | SCR_020176 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer Resource Report Resource Website |
JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020177) | instrument resource | Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability. | Jeol, JEOL, Electron Spin Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JES_X320 | SCR_020177 | 2026-07-25 12:09:22 | 0 | ||||||||||
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JEOL: JEM-2100Plus Transmission Electron Microscope Resource Report Resource Website |
JEOL: JEM-2100Plus Transmission Electron Microscope (RRID:SCR_020173) | instrument resource | Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation. | Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JEM-2100Plus | SCR_020173 | 2026-07-25 12:09:22 | 0 | ||||||||||
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JEOL: JBX-8100FS Electron Beam Lithography System Resource Report Resource Website |
JEOL: JBX-8100FS Electron Beam Lithography System (RRID:SCR_020170) | instrument resource | Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput. | Jeol, JEOL, Electron Beam Lithography System, Instrument Equipment, USEDit, | Commercially available | Model_Number_JBX_8100FS | SCR_020170 | 2026-07-25 12:09:22 | 0 | ||||||||||
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Kratos: AXIS-165 XPS Surface Analylsis System Resource Report Resource Website |
Kratos: AXIS-165 XPS Surface Analylsis System (RRID:SCR_020207) | instrument resource | AXIS Nova combines XPS imaging and spectroscopic capabilities with a highly automated, large sample handling system and is the next generation of AXIS Nova spectrometer. The AXIS Nova is based on Kratos, AXIS technology comprising: magnetic and electrostatic transfer lenses; co-axial electron-only charge neutralisation; spherical mirror and hemispherical electron energy analysers. Kratos developed innovations such as the delay-line detector for spectroscopy and imaging modes and high energy X-ray excitation sources ensure the AXIS Nova is capable of performing in the most demanding research and development environments. | Kratos, Surface Analylsis System, Instrument Equipment, USEDit | Commercially available | Model_Number_AXIS-165 XPS | SCR_020207 | 2026-07-25 12:09:24 | 0 | ||||||||||
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JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) Resource Report Resource Website |
JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) (RRID:SCR_020168) | instrument resource | Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity. | Jeol, JEOL, Electrostatic Hemispherical Analyzer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JAMP_9510F | SCR_020168 | 2026-07-25 12:09:24 | 0 | ||||||||||
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JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer Resource Report Resource Website |
JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer (RRID:SCR_020201) | instrument resource | Mass spectrometer with long flight path that results in ultrahigh resolving power greater than 75,000 and sub ppm mass accuracy. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_SpiralTOF_plus | SCR_020201 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe Resource Report Resource Website |
JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe (RRID:SCR_020208) | instrument resource | Probe that combines performance of broadband probe for heteronuclear measurements and inverse probe for 1H and 19F measurements. | Jeol, JEOL, Nuclear Magnetic Resonance Probe, Instrument Equipment, USEDit, | Commercially available | Model_Number_ROYAL | SCR_020208 | 2026-07-25 12:09:25 | 0 | ||||||||||
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Leica: APO S8 Microscope Resource Report Resource Website |
Leica: APO S8 Microscope (RRID:SCR_020209) | instrument resource | Greenough stereo microscope, Leica S8 APO with apochromatic 8:1 zoom and 75mm working distance allows easy access to specimen even at high magnification up to 80x which is best for quality control, cell sorting and microinjection applications. Ergonomic 38 viewing angle provides comfort, which helps increase productivity, reduce fatigue related inspection errors and acquire precise positioning while working with incident or transmitted light. Adjustable zoom stops allows fast, easy, repeatable measurements and inspections. The Integrated Documentation port allows to connect digital cameras. | Leica, Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020209.pdf | Model_Number_APO S8 | SCR_020209 | 2026-07-25 12:09:23 | 0 | |||||||||
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JEOL: JIB-4700F Focused Ion Beam Resource Report Resource Website |
JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188) | instrument resource | Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens. | Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit, | Commercially available | Model_Number_JIB-4700F | SCR_020188 | 2026-07-25 12:09:25 | 0 |
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Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
