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| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
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Leica: EM AFS2 Freeze Substitution and Low Temperature Embedding System Resource Report Resource Website |
Leica: EM AFS2 Freeze Substitution and Low Temperature Embedding System (RRID:SCR_020222) | instrument resource | System for Light and Electron Microscopy. Performs freeze substitution and progressive lowering of temperature techniques and allows low temperature embedding and polymerization of resins. Leica EM FSP (freeze substitution processor), automatic reagent handling system combined with Leica EM AFS2, dispenses reagents for both freeze substitution and PLT applications. The LED illumination from within the chamber and the attached stereomicroscope for viewing and positioning of samples ensures ease of use. | Leica, freeze substitution system, progressive lowering of temperature, freeze substitution processor, device, Instrument Equipment, USEDit | Restricted | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020222.pdf | Model_Number_EM_AFS2, SCR_020230 | SCR_020222 | Leica EM AFS2 | 2026-07-25 12:09:25 | 0 | ||||||||
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Leica: DM2000 Histology Microscope Resource Report Resource Website 1+ mentions |
Leica: DM2000 Histology Microscope (RRID:SCR_020223) | instrument resource | Leica DM2000 microscopes are best for complex tasks in pathology and cytology. For special diagnostics requirements, the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF). | Leica, Histology Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020223.pdf | Model_Number_DM2000 | SCR_020223 | 2026-07-25 12:09:24 | 3 | |||||||||
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JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer Resource Report Resource Website |
JEOL: JES-X310 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020176) | instrument resource | Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability. | Jeol, JEOL, Electron Spin Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JES_X310 | SCR_020176 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer Resource Report Resource Website |
JEOL: JES-X320 Electron Spin Resonance (ESR) Spectrometer (RRID:SCR_020177) | instrument resource | Electron spin resonance spectrometer that is user friendly and provides high sensitivity, resolution, and stability. | Jeol, JEOL, Electron Spin Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JES_X320 | SCR_020177 | 2026-07-25 12:09:22 | 0 | ||||||||||
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JEOL: JEM-2100Plus Transmission Electron Microscope Resource Report Resource Website |
JEOL: JEM-2100Plus Transmission Electron Microscope (RRID:SCR_020173) | instrument resource | Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation. | Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JEM-2100Plus | SCR_020173 | 2026-07-25 12:09:22 | 0 | ||||||||||
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JEOL: JBX-8100FS Electron Beam Lithography System Resource Report Resource Website |
JEOL: JBX-8100FS Electron Beam Lithography System (RRID:SCR_020170) | instrument resource | Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput. | Jeol, JEOL, Electron Beam Lithography System, Instrument Equipment, USEDit, | Commercially available | Model_Number_JBX_8100FS | SCR_020170 | 2026-07-25 12:09:22 | 0 | ||||||||||
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Kratos: AXIS-165 XPS Surface Analylsis System Resource Report Resource Website |
Kratos: AXIS-165 XPS Surface Analylsis System (RRID:SCR_020207) | instrument resource | AXIS Nova combines XPS imaging and spectroscopic capabilities with a highly automated, large sample handling system and is the next generation of AXIS Nova spectrometer. The AXIS Nova is based on Kratos, AXIS technology comprising: magnetic and electrostatic transfer lenses; co-axial electron-only charge neutralisation; spherical mirror and hemispherical electron energy analysers. Kratos developed innovations such as the delay-line detector for spectroscopy and imaging modes and high energy X-ray excitation sources ensure the AXIS Nova is capable of performing in the most demanding research and development environments. | Kratos, Surface Analylsis System, Instrument Equipment, USEDit | Commercially available | Model_Number_AXIS-165 XPS | SCR_020207 | 2026-07-25 12:09:24 | 0 | ||||||||||
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JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) Resource Report Resource Website |
JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) (RRID:SCR_020168) | instrument resource | Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity. | Jeol, JEOL, Electrostatic Hemispherical Analyzer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JAMP_9510F | SCR_020168 | 2026-07-25 12:09:24 | 0 | ||||||||||
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JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer Resource Report Resource Website |
JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer (RRID:SCR_020201) | instrument resource | Mass spectrometer with long flight path that results in ultrahigh resolving power greater than 75,000 and sub ppm mass accuracy. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_SpiralTOF_plus | SCR_020201 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe Resource Report Resource Website |
JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe (RRID:SCR_020208) | instrument resource | Probe that combines performance of broadband probe for heteronuclear measurements and inverse probe for 1H and 19F measurements. | Jeol, JEOL, Nuclear Magnetic Resonance Probe, Instrument Equipment, USEDit, | Commercially available | Model_Number_ROYAL | SCR_020208 | 2026-07-25 12:09:25 | 0 | ||||||||||
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Leica: APO S8 Microscope Resource Report Resource Website |
Leica: APO S8 Microscope (RRID:SCR_020209) | instrument resource | Greenough stereo microscope, Leica S8 APO with apochromatic 8:1 zoom and 75mm working distance allows easy access to specimen even at high magnification up to 80x which is best for quality control, cell sorting and microinjection applications. Ergonomic 38 viewing angle provides comfort, which helps increase productivity, reduce fatigue related inspection errors and acquire precise positioning while working with incident or transmitted light. Adjustable zoom stops allows fast, easy, repeatable measurements and inspections. The Integrated Documentation port allows to connect digital cameras. | Leica, Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020209.pdf | Model_Number_APO S8 | SCR_020209 | 2026-07-25 12:09:23 | 0 | |||||||||
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JEOL: JIB-4700F Focused Ion Beam Resource Report Resource Website |
JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188) | instrument resource | Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens. | Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit, | Commercially available | Model_Number_JIB-4700F | SCR_020188 | 2026-07-25 12:09:25 | 0 | ||||||||||
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JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) Resource Report Resource Website |
JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186) | instrument resource | Scanning electron microscope that is compact and versatile and delivers high resolution imaging with unsurpassed low kV performance and high sensitivity solid state BSE detector included with LV models. | Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JSM_IT200 | SCR_020186 | 2026-07-25 12:09:23 | 0 | ||||||||||
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JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer Resource Report Resource Website 1+ mentions |
JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer (RRID:SCR_020183) | instrument resource | Nuclear magnetic resonance spectormeter that enables highly sophisticated measurements to be carried out while most routine measurement operations can be performed automatically. | Jeol, JEOL, Nuclear Magnetic Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JNM_ECZR | SCR_020183 | 2026-07-25 12:09:23 | 1 | ||||||||||
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JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer Resource Report Resource Website |
JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer (RRID:SCR_020182) | instrument resource | Mass spectrometer that can be used for wide range of applications such as environmental analysis for agrichemicals and mold odor, material analysis, and aroma analysis. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_JMS_Q1500GC | SCR_020182 | 2026-07-25 12:09:25 | 0 | ||||||||||
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Leica: DFC 452 Microscope Camera Resource Report Resource Website |
Leica: DFC 452 Microscope Camera (RRID:SCR_020215) | instrument resource | Leica DFC495 is a digital camera with 8 Megapixel CCD that quickly captures high-resolution images microscopy in life science.. The scan preview in SXGA resolution provides up to 18 frames per second (fps) and allows the sample to be adjusted and focussed directly on the computer screen. The Peltier cooling reduces noise for imaging in low light conditions. | Leica, Microscope Camera, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020215.pdf | Model_Number_DFC 452 | SCR_020215 | 2026-07-25 12:09:25 | 0 | |||||||||
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JEOL: JIB-4000PLUS Focused Ion Beam Resource Report Resource Website |
JEOL: JIB-4000PLUS Focused Ion Beam (RRID:SCR_020178) | instrument resource | Focused ion bean that is milling and imaging system featuring high performance ion optical column | Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit, | Commercially available | Model_Number_JIB-4000PLUS | SCR_020178 | 2026-07-25 12:09:23 | 0 | ||||||||||
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Leica: Autostainer XL Automated Slide Stainer Resource Report Resource Website 1+ mentions |
Leica: Autostainer XL Automated Slide Stainer (RRID:SCR_020212) | instrument resource | Autostainer XL continues to provide reproducible, consistent, high-quality staining and increased workload throughput. Plus, combine it with the CV5030 Glass Coverslipper to create a workstation that eliminates the manual handling of slide racks between staining and coverslipping. Can be used stand-alone or integrated with the Leica CV5030 Glass Coverslipper to create a ‘walk-away, staining/coverslipping workstation. Upgrade at anytime to match your laboratory's specific needs. | Leica, Automated Slide Stainer, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020212.pdf | Model_Number_Autostainer XL | SCR_020212 | 2026-07-25 12:09:23 | 4 | |||||||||
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JEOL: AccuTOF LC-plus 4G Time-of-Flight Mass Spectrometer Resource Report Resource Website |
JEOL: AccuTOF LC-plus 4G Time-of-Flight Mass Spectrometer (RRID:SCR_020154) | instrument resource | Mass spectrometer with analyzer design that employs elegant ion optics and ADC based digitizer to deliver dynamic range exceeding 4 orders of magnitude, without compromising resolution or mass accuracy. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020154.pdf | Model_Number_LC_plus_4G | SCR_020154 | 2026-07-25 12:09:23 | 0 | |||||||||
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JEOL: 2100F Transmission Electron Microscope Resource Report Resource Website |
JEOL: 2100F Transmission Electron Microscope (RRID:SCR_020155) | instrument resource | JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user's purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control. | JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020155.pdf | Model_Number_2100F | SCR_020155 | 2026-07-25 12:09:24 | 0 |
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Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
