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URL: https://www.metricon.com/model-2010-m-overview
Proper Citation: Metricon: 2010/M Prism Coupler (RRID:SCR_020256)
Description: Refractometer that utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films as well as refractive index of bulk materials. The 2010/M offers advantages over conventional refractometers and instruments based on ellipsometry or spectrophotometry: Completely General no advanced knowledge of optical properties of film/substrate required, Routine index resolution of �.0005 (accuracy of up to �.0001 available for many applications see specifications), Routine index resolution of �.0003 (resolution of up to �.00005 available for many applications see specifications), High accuracy index measurement of bulk, substrate, or liquid materials including birefringence/anisotropy, Rapid (20-second) characterization of thin film or diffused optical waveguides or SPR sensor structures, measurement of index vs wavelength, Options to measure index vs temperature (dn/dT), and waveguide loss, and Wide index measurement range (1.0-3.35).
Resource Type: instrument resource
Keywords: Metricon, Refractometer, Instrument Equipment, USEDit
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Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
