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JEOL: JSM-7900F Field Emission Scanning Electron Microscope (SEM) (RRID:SCR_020191)Copy Citation Copied
URL: https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/FE-SEM/JSM-7900F
Proper Citation: JEOL: JSM-7900F Field Emission Scanning Electron Microscope (SEM) (RRID:SCR_020191)
Description: Scanning electron microscope with flexible platform that combines high resolution imaging with nano scale microanalysis.
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
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