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JEOL: JSM-7610FPlus Field Emission Scanning Electron Microscrope (SEM) (RRID:SCR_020190)Copy Citation Copied
URL: https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/FE-SEM/JSM-7610FPlus
Proper Citation: JEOL: JSM-7610FPlus Field Emission Scanning Electron Microscrope (SEM) (RRID:SCR_020190)
Description: Scaning electron microscope with semi in lens detector with integrated electron energy filter r filter and in lens Schottky field emission gun to deliver ultrahigh spatial resolution with wide range of probe currents for all applications
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
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Source: SciCrunch Registry
Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
