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URL: https://www.jeolusa.com/PRODUCTS/Focused-Ion-Beam/JIB-4700F
Proper Citation: JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188)
Description: Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens.
Resource Type: instrument resource
Keywords: Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit,
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Source: SciCrunch Registry
Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
