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JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186)Copy Citation Copied
Proper Citation: JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186)
Description: Scanning electron microscope that is compact and versatile and delivers high resolution imaging with unsurpassed low kV performance and high sensitivity solid state BSE detector included with LV models.
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
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Source: SciCrunch Registry
Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
