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URL: https://www.jeol.co.jp/en/products/detail/JIB-4000PLUS.html
Proper Citation: JEOL: JIB-4000PLUS Focused Ion Beam (RRID:SCR_020178)
Description: Focused ion bean that is milling and imaging system featuring high performance ion optical column
Resource Type: instrument resource
Keywords: Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit,
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Source: SciCrunch Registry
Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
