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URL: https://www.jeol.co.jp/en/products/detail/JEM-2100F.html
Proper Citation: JEOL: 2100F Transmission Electron Microscope (RRID:SCR_020155)
Description: JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user's purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control.
Resource Type: instrument resource
Keywords: JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit
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Source: SciCrunch Registry
Data set from Kravitz, Owen and Kretizer's 2012 paper "Optogenetic identification of striatal projection neuron subtypes during in vivo recordings."
